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    Code Coverage Measurement in Configurable Software Product Line Testing
    Soobin Han, Jihyun Lee, Seoyeon Go KIPS Transactions on Software and Data Engineering, Vol. 11, No. 7, pp. 273-282, Jul. 2022
    https://doi.org/10.3745/KTSDE.2022.11.7.273
    Keywords: Configurable Software Product Line, Software Product Line Testing, Test Coverage Measurement, Code Coverage